Scanning Electron Microscopy and X-Ray Microanalysis
| Author | : | |
| Rating | : | 4.75 (816 Votes) |
| Asin | : | 149396674X |
| Format Type | : | paperback |
| Number of Pages | : | 658 Pages |
| Publish Date | : | 2015-02-27 |
| Language | : | English |
DESCRIPTION:
27 (4), July/August, 2005)“As the authors pointed out, the number of equations in the book is kept to a minimum, and important conceptions are also explained in a qualitative manner. It is clearly written well organized. Wilson, Scanning, Vol. It is an excellent textbook for graduate students, and an outstanding reference for engineers, physical, and biological scientists.” (Microscopy and Microanalysis, Vol. Form the reviews of the third edition:“There is no other single volume that covers as much theory and practice of SEM or X-ray microanalysis as Scanning Electron Microscopy and X-ray Microanalysis, 3rd Edition does. This is a reference text that no SEM or EPMA laborat
Therefore, special emphasis is placed on beam energy, beam current, electron detector characteristics and controls, and ancillary techniques such as energy dispersive x-ray spectrometry (EDS) and electron backscatter diffraction (EBSD).With 13 years between the publication of the third and fourth editions, new coverage reflects the many improvements in the instrument and analysis techniques. This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the fie